R
[Ryt00] Wojciech Rytter. Compressed and Fully Compressed Pattern-Matching in One and Two Dimensions. Proceedings of the IEEE 88(11):1769 - 1778. IEEE Comp. Soc. Press, November 2000. 
@article{ieee88(11)-Ryt,
  author =              {Rytter, Wojciech},
  title =               {Compressed and Fully Compressed Pattern-Matching in
                         One and Two Dimensions},
  publisher =           {IEEE Comp. Soc. Press},
  journal =             {Proceedings of the IEEE},
  volume =              {88},
  number =              {11},
  pages =               {1769 - 1778},
  year =                {2000},
  month =               nov,
  doi =                 {10.1109/5.892712},
}
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